Research Facilities

Material Preparation

SPUTTER CHAMBER

 

  • Cryogenically pumped to high vacuum, capable of low10E-8 Torr
  • Six DC/RF magnetron sputter guns
  • Ion-beam source
  • Computer-controlled substrate ring holds ten different substrates whose temperatures can be varied from 77 K to 1000 K

COMING SOON:

  • Laser Ablation
  • In-situ SMOKE

VACUUM INDUCTION FURNACE

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

ANNEALING FURNACES

Four furnaces offer temperatures as high as 1200 C, with a choice of ambient gases.

 

Material Characterization

THIN FILM X-RAY DIFFRACTOMETER

This measurement system consists of Philips 3100 X-ray generator, Philips PW1821 multi-purpose Sample stage, thin film system and also X'Pert control and analysis software. Apart from the usual applications like phase determination, thin film thickness analysis, it can also be used for stress analysis and texture analysis.

VIBRATING SAMPLE MAGNETOMETERS

Our magnetic characterization facilities include two Lakeshore Vibrating Sample Magnetometers (VSM) with low (2.2Tesla) and high field (9 tesla) measuring capability at temperatures between 4 and about 1000K. The electromagnet VSM goes to a field of 14kOe and has an oven capable of reaching 1000°C. Our superconducting magnet goes to a field of 9 tesla and measures to below 4.2K.

 

HIGH FREQUENCY ELECTROMAGNETIC RESPONSE MEASUREMENTS

Agilent Technologies High Frequency Network Analyser with S-parameter Test Set and High Power Option.The built-in S-parameter test set provides a full range of magnitude and phase measurements in both the forward and reverse directions. Built-in vector accuracy enhancement techniques include full two-port, adapter-removal, and optional TRL calibration.

50 MHz to 40 GHz
100 dB of dynamic range

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

ELECTROCHEMICAL DEPOSITION

Potentiostat / Galvanostat

Computer-controlled Potentiostat/Galvanostat
100 V compliance, 2 A current output

Potentiostatic
Potentiodynamic
Cyclic Voltammogram
Potential Square-Wave
Potential Stair-Step
Potential Scan/Hold
Polarization Resistance
Square-Wave Voltammetry
Galvanostatic
Galvanodynamic
Galvanic Square-Wave
Galvanic Cycle
E & I Noise