Specifications for Jeol JEM-100CX II TEM
Configuration Side Entry Configuration Top Entry Configuration
| Resolution | ||
| Lattice image | 0.2nm | 0.14nm |
| Point image | 0.4nm | 0.3nm |
| Accelerating voltage | ||
| 20.40.60.80.100kV | 20.40.60.80.100kV | |
| Electrical Stability | ||
| Accelerating voltage | 2x10-6 /min | 2x10-4 /min |
| Objective lens current | 1x10-6 /min | 1x10-4 /min |
| Magnification(steps) | ||
| MAG mode | 500~450.000x(23) | 1.000~850.000x(23) |
| LOW MAG mode | 100~600x(4) | 100~600x(4) |
| SA MAG mode | 6.700~140.000x(11) | 13.000~280.000x(11) |
| Camera length (steps) | ||
| Selected area diff. | 160~240.000mm(6) | 80~120.000mm(6) |
| High dispersion diff. | 5.5~67m(6) | 5.5~67m(6) |
| Objective lens | ||
| Focal length | 3.2mm | 1.6mm |
| Spherical abberation | 2.8mm | 1.4mm |
| Chromatic abberation | 2.6mm | 1.4mm |
| Minimum focal step | 9nm | 4nm |
| Specimen Chamber | ||
|
Number of specimens/load |
2 | 6 |
| Tilt angle | ±30° ( X ) | 0° |
| Specimen movement | 8.5mm ( X ) 2mm (Y ) 1mm( Z ) |
2mm( X ) 2mm( Y ) |
For additional specifications: Adobe Acrobat file